| Program |
Principal Investigator |
Program Title |
| Science Observations Scheduled |
| 12192 |
James Lauroesch, University of Louisville Research Foundation, Inc. |
A SNAPSHOT Survey of Interstellar Absorption Lines |
| 12328 |
Pieter van Dokkum, Yale University |
3D-HST: A Spectroscopic Galaxy Evolution Treasury Part 2 |
| 12460 |
Marc Postman, Space Telescope Science Institute |
Through a Lens, Darkly - New Constraints on the Fundamental Components of the Cosmos |
| 12488 |
Mattia Negrello, Open University |
SNAPshot observations of gravitational lens systems discovered via wide-field Herschel imaging |
| 12534 |
Harry Teplitz, California Institute of Technology |
The Panchromatic Hubble Ultra Deep Field: Ultraviolet Coverage |
| 12578 |
N. Forster Schreiber, Max-Planck-Institut fur extraterrestrische Physik |
Constraints on the Mass Assembly and Early Evolution of z~2 Galaxies: Witnessing the Growth of Bulges and Disks |
| 12679 |
Adam Riess, The Johns Hopkins University |
Luminosity-Distance Standards from Gaia and HST |
| Calibration Observations Scheduled |
| 12380 |
Bryan Hilbert, Space Telescope Science Institute |
Guard Darks |
| 12688 |
Tiffany Borders, Space Telescope Science Institute |
Cycle 17: UVIS Bowtie Monitor |
| 12689 |
Tiffany Borders, Space Telescope Science Institute |
WFC3 UVIS CCD Daily Monitor |
| 12697 |
Bryan Hilbert, Space Telescope Science Institute |
IR Gain Monitor |
| 12729 |
David Golimowski, Space Telescope Science Institute |
CCD Daily Monitor {Part 1} |
| 12741 |
Justin Ely, Space Telescope Science Institute |
CCD Dark Monitor Part 1 |
| 12743 |
Justin Ely, Space Telescope Science Institute |
CCD Bias and Read Noise Monitor Part 1 |
| 12784 |
Elena Sabbi, Space Telescope Science Institute - ESA |
Characterization of UVIS Traps Via Charge-Injected Biases |
| 12794 |
John MacKenty, Space Telescope Science Institute |
Repeatability of High Precision Photometry and Astrometry in Spatially Scanned UVIS Data |
| 12798 |
Sylvia Baggett, Space Telescope Science Institute |
Bias, Dark, and Charge Injection {CI} for UVIS Binned mode |