Program |
Principal Investigator |
Program Title |
Science Observations Scheduled |
14481 |
Jelle Kaastra, Space Research Organization Netherlands |
Shining light on obscured AGN outflows |
14594 |
Rich Bielby, Durham Univ. |
QSAGE: QSO Sightline And Galaxy Evolution |
14606 |
Brooke Simmons, University of California - San Diego |
Secular Black Hole Growth and Feedback in Merger-Free Galaxies |
14634 |
Denis Grodent, Universite de Liege |
HST-Juno synergistic approach of Jupiter's magnetosphere and ultraviolet auroras |
14661 |
Michael Wong, University of California - Berkeley |
Wide Field Coverage for Juno (WFCJ): Jupiter's 2D Wind Field and Cloud Structure |
14700 |
Ben Sugerman, Goucher College |
Light Echoes and the Environments of SNe 2014J and 2016adj |
14762 |
Justyn Maund, University of Sheffield |
A UV census of the sites of core-collapse supernovae |
Calibration Observations Scheduled |
14506 |
David Golimowski, Space Telescope Science Institute |
CCD Daily Monitor (Part 1) |
14509 |
David Golimowski, Space Telescope Science Institute |
CCD Hot Pixel Annealing |
14520 |
Mees Fix, Space Telescope Science Institute |
FUV Detector Dark Monitor |
14521 |
Mees Fix, Space Telescope Science Institute |
NUV Detector Dark Monitor |
14530 |
Ben Sunnquist, Space Telescope Science Institute |
UVIS Bowtie Monitor |
14531 |
Matthew Bourque, Space Telescope Science Institute |
WFC3 UVIS Daily Monitor A |
14535 |
Catherine Martlin, Space Telescope Science Institute |
UVIS post-flash monitor |
14542 |
Catherine Martlin, Space Telescope Science Institute |
WFC3 UVIS Traps with CI |
14549 |
Peter McCullough, Space Telescope Science Institute |
WFC3 CSM monitor with earth flats |
14817 |
Allyssa Riley, Space Telescope Science Institute |
CCD Dark Monitor Part 1 |
14820 |
Allyssa Riley, Space Telescope Science Institute |
STIS CCD Bias and Read Noise Monitor Part 1 |
14824 |
John Debes, Space Telescope Science Institute |
STIS CCS Imaging Flats Cycle 24 |
14880 |
Jay Anderson, Space Telescope Science Institute |
WFC3 UVIS CTE Model Re-Characterization |